Electron Microscopes

Electron microscopes, which use beams of electrons instead of light, are designed for very high magnification usage. Electrons, which have a much smaller wavelength than visible light, allow a much higher resolution. The main limitation of the electron beam is that it must pass through a vacuum as air molecules would otherwise scatter the beam.
Instead of relying on refraction, lenses for electron microscopes are specially designed electromagnets which generates magnetic fields that are approximately parallel to the direction that electrons travel. The electrons are typically detected by a phosphor screen, photographic film or a CCD.

Two major variants of electron microscopes exist:

Scanning electron microscope: looks at the surface of bulk objects by scanning the surface with a fine electron beam and measuring reflection. May also be used for spectroscopy.
Transmission electron microscope: passes electrons completely through the sample, analogous to basic optical microscopy. This requires careful sample preparation, since electrons are scattered so strongly by most materials. It can also obtain detailed information on the sample's crystallography through selected area diffraction.